FOS 737 Microscopy, Spectrometry and Diffraction with Electrons in Forensic and Chemical Analysis
This is a lecture, demonstration and laboratory class that will introduce the student to the theory and applications of electron microscopy as well as that of x-ray spectrometry to forensic and chemical analysis. Diffraction theory in electron microscopes will also be introduced. The class will concentrate on Scanning Electron Microscopy (SEM), with less emphasis on Transmission Electron (TEM) and Analytical Electron Microscopy (AEM) techniques.
Prerequisite
None